Projektu virzības (STK griezumā) https:/www.lvs.lv/projects WI FAKE-92612. ISO/AWI 26100 - Microbeam analysis — Analytical electron microscopy — The thickness measurement of thin foil by electron energy loss spectroscopy Projekts sasniedzis stadiju 10.99 datumā 23.10.2025. Nākamā stadija 20.00. Atbildīgā komiteja: ISO/TC 202/SC 3. https:/www.lvs.lv/projects/project/475632 475632 Fri, 25 Jul 2025 04:15:35 +0300 WI FAKE-91808. ISO/AWI 25871 - Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction Projekts sasniedzis stadiju 10.99 datumā 28.07.2025. Nākamā stadija 20.00. Atbildīgā komiteja: ISO/TC 202/SC 3. https:/www.lvs.lv/projects/project/473856 473856 Sat, 12 Apr 2025 02:07:18 +0300 WI FAKE-91667. ISO/PWI 25836 - Microbeam analysis – Analytical electron microscope - Phase identification of metals and oxides by precession electron diffraction Projekts sasniedzis stadiju 00.00 datumā 19.03.2025. Nākamā stadija 00.20. Atbildīgā komiteja: ISO/TC 202/SC 3. https:/www.lvs.lv/projects/project/473467 473467 Thu, 20 Mar 2025 08:11:05 +0200 WI FAKE-91666. ISO/NP 25835 - Microbeam analysis — Analytical electron microscopy — Method for data acquisition and processing of three-dimensional electron diffraction Projekts sasniedzis stadiju 10.00 datumā 16.04.2026. Nākamā stadija 10.20. Atbildīgā komiteja: ISO/TC 202/SC 3. https:/www.lvs.lv/projects/project/473466 473466 Thu, 20 Mar 2025 08:11:04 +0200 WI FAKE-90100. ISO 25387 - Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscopes Projekts sasniedzis stadiju 60.00 datumā 29.04.2026. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 37.020 https:/www.lvs.lv/projects/project/469606 469606 Sat, 27 Jul 2024 01:51:53 +0300 WI FAKE-90097. ISO/PWI 25386 - Microbeam Analysis-Analytical Electron Microscopy-The main performance parameters and design specifications of the TEM standard grid Projekts sasniedzis stadiju 10.60 datumā 18.10.2024. Nākamā stadija 00.60. Atbildīgā komiteja: ISO/TC 202/SC 3. https:/www.lvs.lv/projects/project/469563 469563 Thu, 25 Jul 2024 02:07:46 +0300 WI FAKE-87733. ISO 25498:2025 - Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope Projekts sasniedzis stadiju 60.60 datumā 15.05.2025. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.50 https:/www.lvs.lv/projects/project/386310 386310 Wed, 13 Sep 2023 08:49:22 +0300 WI FAKE-87682. ISO 20263:2024 - Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials Projekts sasniedzis stadiju 60.60 datumā 06.11.2024. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 37.020, 71.040.50 https:/www.lvs.lv/projects/project/386179 386179 Tue, 29 Aug 2023 20:50:54 +0300 WI FAKE-86942. ISO 29301:2023 - Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures Projekts sasniedzis stadiju 60.60 datumā 16.10.2023. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 37.020 https:/www.lvs.lv/projects/project/384925 384925 Sat, 13 May 2023 06:32:57 +0300 WI FAKE-86203. ISO 19214:2024 - Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy Projekts sasniedzis stadiju 60.60 datumā 16.10.2024. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.50 https:/www.lvs.lv/projects/project/383101 383101 Tue, 06 Dec 2022 06:03:47 +0200 WI FAKE-84838. ISO/DIS 16887 - Microbeam analysis — Analytical electron microscopy — Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system Projekts sasniedzis stadiju 40.00 datumā 23.12.2025. Nākamā stadija 40.20. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.50 https:/www.lvs.lv/projects/project/380321 380321 Sat, 19 Mar 2022 17:58:23 +0200 WI FAKE-84289. ISO/WD 13139 - Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals Projekts sasniedzis stadiju 20.20 datumā 22.08.2024. Nākamā stadija 20.60. Atbildīgā komiteja: ISO/TC 202/SC 3. https:/www.lvs.lv/projects/project/372940 372940 Wed, 01 Dec 2021 04:23:23 +0200 WI A00008:10:079091. ISO 24639:2022 - Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy Projekts sasniedzis stadiju 60.60 datumā 05.07.2022. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.50 https:/www.lvs.lv/projects/project/362160 362160 Mon, 05 Aug 2019 09:57:57 +0300 WI A00008:10:075516. ISO 23420:2021 - Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis Projekts sasniedzis stadiju 60.60 datumā 23.04.2021. Nākamā stadija 90.20. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.50 https:/www.lvs.lv/projects/project/355201 355201 Wed, 28 Feb 2018 11:35:33 +0200 WI A00008:10:070359. ISO 25498:2018 - Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope Projekts sasniedzis stadiju 90.92 datumā 12.09.2023. Nākamā stadija 95.99. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.50 https:/www.lvs.lv/projects/project/341122 341122 Mon, 07 Dec 2015 12:40:02 +0200 WI A00008:10:070360. ISO 29301:2017 - Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures Projekts sasniedzis stadiju 99.60 datumā 16.10.2023. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 37.020 https:/www.lvs.lv/projects/project/341121 341121 Mon, 07 Dec 2015 12:40:02 +0200 WI A00008:10:045355. ISO/WD 29222 - Standards for thickness measurement of thin films by TEM-EELS and STEM-EDS analytical electron microscopy at the nanometer and sub-nanometer level Projekts sasniedzis stadiju 20.00 datumā 20.02.2007. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.99 https:/www.lvs.lv/projects/project/273536 273536 Wed, 15 Oct 2014 23:43:43 +0300 WI A00008:10:067438. ISO 20263:2017 - Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials Projekts sasniedzis stadiju 90.92 datumā 28.08.2023. Nākamā stadija 95.99. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 37.020, 71.040.50 https:/www.lvs.lv/projects/project/229440 229440 Wed, 15 Oct 2014 22:15:23 +0300 WI A00008:10:064022. ISO 19214:2017 - Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy Projekts sasniedzis stadiju 90.92 datumā 30.11.2022. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.50 https:/www.lvs.lv/projects/project/226982 226982 Wed, 15 Oct 2014 22:09:47 +0300 WI A00008:10:060576. ISO/WD 17802 - Microbeam analysis — Analytical transmission electron microscopy — Methods of the energy calibration for electron energy loss spectroscopy Projekts sasniedzis stadiju 20.00 datumā 08.06.2012. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.50 https:/www.lvs.lv/projects/project/224652 224652 Wed, 15 Oct 2014 22:04:24 +0300 WI A00008:10:042952. ISO/NP 25499 - Guidelines for the energy calibration and energy resolution determination methods for electron energy loss spectroscopy Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.99 https:/www.lvs.lv/projects/project/219814 219814 Wed, 15 Oct 2014 21:53:18 +0300 WI A00008:10:042950. ISO/NP 25497 - Guidelines for the determination of experimental parameters for electron energy loss spectroscopy Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.99 https:/www.lvs.lv/projects/project/219813 219813 Wed, 15 Oct 2014 21:53:17 +0300 WI A00008:10:032939. ISO/CD 17270 - Analytical electron microscopy — Test method to determine experimental parameters for electron energy loss spectroscopy (EELS) Projekts sasniedzis stadiju 30.99 datumā 17.09.2002. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.99 https:/www.lvs.lv/projects/project/215493 215493 Wed, 15 Oct 2014 21:43:35 +0300 WI A00008:10:042951. ISO 25498:2010 - Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope Projekts sasniedzis stadiju 99.60 datumā 16.03.2018. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 71.040.50 https:/www.lvs.lv/projects/project/202821 202821 Mon, 17 May 2010 00:00:00 +0300 WI A00008:10:045399. ISO 29301:2010 - Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures Projekts sasniedzis stadiju 99.60 datumā 06.12.2017. Atbildīgā komiteja: ISO/TC 202/SC 3. ICS: 37.020 https:/www.lvs.lv/projects/project/189504 189504 Mon, 17 May 2010 00:00:00 +0300