IEC 61010-031:2022 specifies safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement, and their related accessories. These probe assemblies are for non-contact or direct electrical connection between a part and electrical test and measurement equipment. They can be fixed to the equipment or be detachable accessories for the equipment.
It has the status of a group safety publication in accordance with IEC Guide 104.
This third edition cancels and replaces the second edition published in 2015, and Amendment 1:2018. IEC 61010-031 is a stand-alone standard. This edition includes the following significant technical changes with respect to the previous edition:
<ol style="list-style-type:lower-alpha">
<li style="text-align:justify">the scope has been made succinct. General information from the scope of Edition 2 has been moved to a new Clause 4. Consequently, Clause 4 to Clause 8 of Edition 2 have been renumbered. Clause 9 of Edition 2 has been deleted;</li>
<li style="text-align:justify">in Clause 2, normative references have been dated and new normative references have been added;</li>
<li style="text-align:justify">in 3.1.4, the definition of probe tip has been modified;</li>
<li style="text-align:justify">in 4.1, there is no longer any differentiation between high voltage and low voltage probe assemblies. Type C probe assemblies have been merged with Type B probe assemblies;</li>
<li style="text-align:justify">in 4.1 d) "Kelvin" probes have been added to the list of probe assemblies as a new Type E and a new Figure 5;</li>
<li style="text-align:justify">in 4.1 e), probes for voltage measurement without electrical connection to conductors have been added to the list of probe assemblies as a new Type F and a new Figure 6;</li>
<li style="text-align:justify">in 4.2.1, spread of fire is no longer considered as a hazard;</li>
<li style="text-align:justify">Subclause 4.4.2.5 from Edition 2 has been deleted;</li>
<li style="text-align:justify">Subclause 4.4.4.3 from Edition 2 has been deleted;</li>
<li style="text-align:justify" value="10">in 5.4.4.1 consideration has been given to spacings and impedance;</li>
<li style="text-align:justify">in 6.1.1, removable parts of probe tips which bear markings are allowed;</li>
<li style="text-align:justify">in 6.1.5, the voltage to be marked for measurement categories is the AC line-to-neutral or DC voltage;</li>
<li style="text-align:justify">in 7.4.2, requirements for unmated connectors have been modified as follows:
<ol>
<li style="text-align:justify">Table 2 has been modified and expanded,</li>
<li style="text-align:justify">a calculation method for clearances of connectors above 20 kV has been defined,</li>
<li style="text-align:justify">creepage distances have been aligned with clearances;</li>
</ol>
</li>
<li style="text-align:justify" value="14">in 7.4.3.1 and 7.4.3.5, requirements for IP2X probe tips with retractable sleeve have been added;</li>
<li style="text-align:justify">in 7.4.3.2, Probe tips are now applicable to non-contact probe assemblies;</li>
<li style="text-align:justify">in 7.5.2.3.2, the values of Table 5 have been modified;</li>
<li style="text
Registration number (WIID)
74559
Scope
IEC 61010-031:2022 specifies safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement, and their related accessories. These probe assemblies are for non-contact or direct electrical connection between a part and electrical test and measurement equipment. They can be fixed to the equipment or be detachable accessories for the equipment.
It has the status of a group safety publication in accordance with IEC Guide 104.
This third edition cancels and replaces the second edition published in 2015, and Amendment 1:2018. IEC 61010-031 is a stand-alone standard. This edition includes the following significant technical changes with respect to the previous edition:
<ol style="list-style-type:lower-alpha">
<li style="text-align:justify">the scope has been made succinct. General information from the scope of Edition 2 has been moved to a new Clause 4. Consequently, Clause 4 to Clause 8 of Edition 2 have been renumbered. Clause 9 of Edition 2 has been deleted;</li>
<li style="text-align:justify">in Clause 2, normative references have been dated and new normative references have been added;</li>
<li style="text-align:justify">in 3.1.4, the definition of probe tip has been modified;</li>
<li style="text-align:justify">in 4.1, there is no longer any differentiation between high voltage and low voltage probe assemblies. Type C probe assemblies have been merged with Type B probe assemblies;</li>
<li style="text-align:justify">in 4.1 d) "Kelvin" probes have been added to the list of probe assemblies as a new Type E and a new Figure 5;</li>
<li style="text-align:justify">in 4.1 e), probes for voltage measurement without electrical connection to conductors have been added to the list of probe assemblies as a new Type F and a new Figure 6;</li>
<li style="text-align:justify">in 4.2.1, spread of fire is no longer considered as a hazard;</li>
<li style="text-align:justify">Subclause 4.4.2.5 from Edition 2 has been deleted;</li>
<li style="text-align:justify">Subclause 4.4.4.3 from Edition 2 has been deleted;</li>
<li style="text-align:justify" value="10">in 5.4.4.1 consideration has been given to spacings and impedance;</li>
<li style="text-align:justify">in 6.1.1, removable parts of probe tips which bear markings are allowed;</li>
<li style="text-align:justify">in 6.1.5, the voltage to be marked for measurement categories is the AC line-to-neutral or DC voltage;</li>
<li style="text-align:justify">in 7.4.2, requirements for unmated connectors have been modified as follows:
<ol>
<li style="text-align:justify">Table 2 has been modified and expanded,</li>
<li style="text-align:justify">a calculation method for clearances of connectors above 20 kV has been defined,</li>
<li style="text-align:justify">creepage distances have been aligned with clearances;</li>
</ol>
</li>
<li style="text-align:justify" value="14">in 7.4.3.1 and 7.4.3.5, requirements for IP2X probe tips with retractable sleeve have been added;</li>
<li style="text-align:justify">in 7.4.3.2, Probe tips are now applicable to non-contact probe assemblies;</li>
<li style="text-align:justify">in 7.5.2.3.2, the values of Table 5 have been modified;</li>
<li style="text
