Project No.LVS EN 61280-2-2:2005
TitleDescribes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
Registration number (WIID)48469
ScopeDescribes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
StatusAtcelts
ICS group33.180.01