CLC/SR 86C
| Project No. | EN 61280-2-2:1999 |
|---|---|
| Title | Describes a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask. |
| Registration number (WIID) | 57424 |
| Scope | Describes a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask. |
| Status | Atcelts |
| ICS group | 33.180.01 |