This European Standard deals with the verification of nominal dry film thickness values on rough surfaces, the adjustment of instruments, definition of inspection areas, sampling plans, measuring and acceptance/rejection criteria.
For the purposes of this standard, any specified thickness is taken to be nominal as defined in EN ISO 12944.
The procedure is based on methods described in EN ISO 2808:1999, Method No. 10, using instruments of the permanent magnet and inductive magnet type, adjusted on a smooth, flat, steel plate, in accordance with EN ISO 2808:1999, Method No. 6.
The dry film thickness is obtained by using a correction value applied to readings based on adjustment on a smooth, flat, steel surface.
Where individual readings, based on smooth, flat steel surface adjustment without the use of correction values, are specified or agreed, it is important to recognize that this method does not conform with this European Standard.
When nominal dry film thicknesses less than 40 µm are specified, this standard shall not be used.
Registration number (WIID)
4982
Scope
This European Standard deals with the verification of nominal dry film thickness values on rough surfaces, the adjustment of instruments, definition of inspection areas, sampling plans, measuring and acceptance/rejection criteria.
For the purposes of this standard, any specified thickness is taken to be nominal as defined in EN ISO 12944.
The procedure is based on methods described in EN ISO 2808:1999, Method No. 10, using instruments of the permanent magnet and inductive magnet type, adjusted on a smooth, flat, steel plate, in accordance with EN ISO 2808:1999, Method No. 6.
The dry film thickness is obtained by using a correction value applied to readings based on adjustment on a smooth, flat, steel surface.
Where individual readings, based on smooth, flat steel surface adjustment without the use of correction values, are specified or agreed, it is important to recognize that this method does not conform with this European Standard.
When nominal dry film thicknesses less than 40 µm are specified, this standard shall not be used.