Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements.
IEC 61967-1 specifies general conditions and definitions of the test methods.
This consolidated version consists of the first edition (2002)
and its amendment 1 (2006). Therefore, no need to order amendment in
addition to this publication.
Registration number (WIID)
9881
Scope
Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements.
IEC 61967-1 specifies general conditions and definitions of the test methods.
This consolidated version consists of the first edition (2002)
and its amendment 1 (2006). Therefore, no need to order amendment in
addition to this publication.
