CEN/TC 290
| Project No. | LVS EN ISO 25178-607:2019 |
|---|---|
| Title | This part of ISO 25178 describes the metrological characteristics of confocal microscopy (CM) systems for 3D mapping of surface topography. |
| Registration number (WIID) | 60591 |
| Scope | This part of ISO 25178 describes the metrological characteristics of confocal microscopy (CM) systems for 3D mapping of surface topography. |
| Status | Standarts spēkā |
| ICS group | 17.040.20 |