CEN/TC 290
| Project No. | EN ISO 3274:1997 |
|---|---|
| Title | Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979. |
| Registration number (WIID) | 14386 |
| Scope | Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979. |
| Status | Atcelts |
| ICS group | 17.040.30 |