CEN/TC 290
| Project No. | EN ISO 25178-604:2013 |
|---|---|
| Title | ISO 25178-604:2013 specifies the metrological characteristics of coherence scanning interferometry (CSI) systems for 3D mapping of surface height. |
| Registration number (WIID) | 31349 |
| Scope | ISO 25178-604:2013 specifies the metrological characteristics of coherence scanning interferometry (CSI) systems for 3D mapping of surface height. |
| Status | Atcelts |
| ICS group | 17.040.20 |