ISO/TC 38/SC 23
| Project No. | ISO 15625:2014 |
|---|---|
| Title | <p>ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.</p> <p>It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.</p> |
| Registration number (WIID) | 55447 |
| Scope | <p>ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.</p> <p>It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.</p> |
| Status | Standarts spēkā |
| ICS group | 59.080.01 |