<p>This document specifies a low-voltage test method for detecting and locating defects (pores, cracks or pop-offs) that occur in enamel coatings of corrugated and/or undulated profiles and that extend down to the metal base.</p>
<p>The method is based on colour effects (optical method) and is applicable to the precise detection of defects and their exact position. It can be used for non-flat, more profiled shapes such as corrugated or undulated surfaces.</p>
<p>NOTE The low-voltage test is a non-destructive test for detecting defects extending down to the metal base and is, therefore, completely different in comparison to the high-voltage test in accordance with ISO 2746.</p>
Registration number (WIID)
73455
Scope
<p>This document specifies a low-voltage test method for detecting and locating defects (pores, cracks or pop-offs) that occur in enamel coatings of corrugated and/or undulated profiles and that extend down to the metal base.</p>
<p>The method is based on colour effects (optical method) and is applicable to the precise detection of defects and their exact position. It can be used for non-flat, more profiled shapes such as corrugated or undulated surfaces.</p>
<p>NOTE The low-voltage test is a non-destructive test for detecting defects extending down to the metal base and is, therefore, completely different in comparison to the high-voltage test in accordance with ISO 2746.</p>
