<p class="MsoBodyText"><span lang="EN-GB">This document specifies requirements for multispectral imaging devices to measure and compare the decorative surfaces. Based on spatially resolved spectral measurement of reflecting surfaces, tristimulus images are computed. A metric is provided that reflects the visual closeness between a reference surface and a comparison surface using a single index called SIM_PDE. Recommendations are provided with regard to laboratory sample preparation.</span></p>
<p class="MsoBodyText"><span lang="EN-GB">This document is not applicable to functional surfaces.</span></p>
Registration number (WIID)
83589
Scope
<p class="MsoBodyText"><span lang="EN-GB">This document specifies requirements for multispectral imaging devices to measure and compare the decorative surfaces. Based on spatially resolved spectral measurement of reflecting surfaces, tristimulus images are computed. A metric is provided that reflects the visual closeness between a reference surface and a comparison surface using a single index called SIM_PDE. Recommendations are provided with regard to laboratory sample preparation.</span></p>
<p class="MsoBodyText"><span lang="EN-GB">This document is not applicable to functional surfaces.</span></p>
