ISO/TC 172/SC 5
| Project No. | ISO 8576:1996 |
|---|---|
| Title | <p>Establishes a reference system incorporating all calibrated motions of rotation and displacement on the microscope and its accessories so that the measuring procedures are uniform. Particular attention is given to the polarization parameters and measuring accessories.</p> |
| Registration number (WIID) | 15862 |
| Scope | <p>Establishes a reference system incorporating all calibrated motions of rotation and displacement on the microscope and its accessories so that the measuring procedures are uniform. Particular attention is given to the polarization parameters and measuring accessories.</p> |
| Status | Standarts spēkā |
| ICS group | 37.020 |