| Title | <p><span lang="EN-GB">This document specifies the procedure for a quantitative determination of major and trace element concentrations in homogeneous solid waste, soil, soil-like material and sludge by energy dispersive X-ray fluorescence (EDXRF) spectrometry or wavelength dispersive X-ray fluorescence (WDXRF) spectrometry using a calibration with matrix-matched standards.</span></p>
<p><span lang="EN-GB">This document is applicable for the following elements: Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Te, I, Cs, Ba, Ta, W, Hg, Tl, Pb, Bi, Th and U. Concentration levels between a mass fraction of approximately 0,000 1 % and 100 % can be determined depending on the element and the instrument used.</span></p>
<p><span lang="EN-GB">An optional XRF screening method for solid and liquid material as waste, sludge and soil is added in <!-- [if supportFields]><span style='color:#0563C1'><span
style='mso-element:field-begin'></span><span
style='mso-spacerun:yes'> </span>REF Annex_sec_A \r \h <span style='mso-element:
field-separator'></span></span><![endif]-->Annex A<!-- [if gte mso 9]><xml>
<w:data>08D0C9EA79F9BACE118C8200AA004BA90B02000000080000000C00000041006E006E00650078005F007300650063005F0041000000</w:data>
</xml><![endif]--><!-- [if supportFields]><span style='color:#0563C1'><span
style='mso-element:field-end'></span></span><![endif]--> which provides a total element characterization at a semi-quantitative level, where the calibration is based on matrix-independent calibration curves, previously set up by the manufacturer.</span></p> |
|---|
| Scope | <p><span lang="EN-GB">This document specifies the procedure for a quantitative determination of major and trace element concentrations in homogeneous solid waste, soil, soil-like material and sludge by energy dispersive X-ray fluorescence (EDXRF) spectrometry or wavelength dispersive X-ray fluorescence (WDXRF) spectrometry using a calibration with matrix-matched standards.</span></p>
<p><span lang="EN-GB">This document is applicable for the following elements: Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Te, I, Cs, Ba, Ta, W, Hg, Tl, Pb, Bi, Th and U. Concentration levels between a mass fraction of approximately 0,000 1 % and 100 % can be determined depending on the element and the instrument used.</span></p>
<p><span lang="EN-GB">An optional XRF screening method for solid and liquid material as waste, sludge and soil is added in <!-- [if supportFields]><span style='color:#0563C1'><span
style='mso-element:field-begin'></span><span
style='mso-spacerun:yes'> </span>REF Annex_sec_A \r \h <span style='mso-element:
field-separator'></span></span><![endif]-->Annex A<!-- [if gte mso 9]><xml>
<w:data>08D0C9EA79F9BACE118C8200AA004BA90B02000000080000000C00000041006E006E00650078005F007300650063005F0041000000</w:data>
</xml><![endif]--><!-- [if supportFields]><span style='color:#0563C1'><span
style='mso-element:field-end'></span></span><![endif]--> which provides a total element characterization at a semi-quantitative level, where the calibration is based on matrix-independent calibration curves, previously set up by the manufacturer.</span></p> |
|---|
