ISO/TC 213
| Project No. | ISO 11562:1996 |
|---|---|
| Title | <p>Describes the metrological characteristics of phase correct filters for the measurement of surface profiles. In particular it specifies how to separate the long and short wave content of a surface profile.</p> |
| Registration number (WIID) | 21977 |
| Scope | <p>Describes the metrological characteristics of phase correct filters for the measurement of surface profiles. In particular it specifies how to separate the long and short wave content of a surface profile.</p> |
| Status | Atcelts |
| ICS group | 17.040.20 |