Registration number (WIID)Project No.TitleStatus
45559LVS EN 61300-2-2:2003Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-2: Tests: Mating durabilityAtcelts
45501LVS EN 61300-2-47:2011Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-47: Tests - Thermal shocks (IEC 61300-2-47:2010)Atcelts
45501EN 61300-2-47:2010Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-47: Tests - Thermal shocksAtcelts
45498EN 61754-6:1997Fibre optic connector interfaces - Part 6: Type MU connector familyAtcelts
45498LVS EN 61754-6:2003 +A1Fibre optic connector interfaces - Part 6: Type MU connector familyAtcelts
45497LVS EN 61300-3-53:2015Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-53: Examinations and measurements - Encircled angular flux (EAF) measurement method based on two-dimensional far field data from step index multimode waveguide (including fibre)Atcelts
45497EN 61300-3-53:2015Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-53: Examinations and Measurements - Encircled angular flux (EAF) measurement method based on two-dimensional far field data from step index multimode waveguide (including fibre)Atcelts
45495LVS EN 61300-2-14:2002Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-14: Tests - Maximum input powerAtcelts
45495EN 61300-2-14:1997Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-14: Tests - Maximum input powerAtcelts
45488LVS EN 61300-2-2:2010/AC:2016Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-2: Tests - Mating durabilityStandarts spēkā
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