Registration number (WIID)Project No.TitleStatus
80195FprEN IEC 60794-1-122:2026Optical fibre cables - Part 1-122: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Buffered fibre movement under compression in optical fibre cables for use in patch cords, Method E22Izstrādē
80106FprEN IEC 60794-1-136:2026Optical fibre cables - Part 1-136: Generic specification - Basic optical cable test procedures - Determination of the maximum applicable push force during cable installation by blowingIzstrādē
79948prEN IEC 60794-1-105Optical fibre cables - Part 1-105: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Strippability of buffered optical fibres, method e5Izstrādē
79900FprEN IEC 60794-1-127:2026Optical fibre cables - Part 1-127: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Indoor simulated installation test, Method E27Izstrādē
79897prEN IEC 60794-1-135:2025Optical fibre cables - Part 1-135: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Sheave test, Method E35Aptauja slēgta
79809prEN IEC 60794-1-118:2026Optical fibre cables - Part 1-118: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Bending under tension, Method E18Aptauja
79651FprEN IEC 60794-1-125:2026Optical fibre cables - Part 1-125: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Ripcord functional test, Method E25Izstrādē
79486EN IEC 60794-1-107:2025Optical fibre cables - Part 1-107: Generic specification - Basic optical cable test procedures - Mechanical test methods - Torsion, method E7Standarts spēkā
79486LVS EN IEC 60794-1-107:2025Optical fibre cables - Part 1-107: Generic specification - Basic optical cable test procedures - Mechanical test methods - Torsion, method E7Standarts spēkā
79485LVS EN IEC 60794-1-129:2025Optical fibre cables - Part 1-129: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Straight midspan access to optical elements, Method E29Standarts spēkā
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