CLC/TC 210
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 52782 | EN 55022:1998/A1:2000/corrigendum Sep. 2006 | Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement | Atcelts |
| 45505 | ENV 55102-1:1993 | Electromagnetic compatibility requirements for ISDN terminal equipment - Part 1: Emission requirements | Atcelts |
| 52995 | LVS EN 61000-3-3:1995/A1:2001 | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection | Atcelts |
| 52982 | EN 61000-3-2:1995/A1:1998 | Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current up to and including 16 A per phase) | Atcelts |
| 54558 | LVS EN 55011:1991 + A1:1997 | Limits and methods of measurement of radio disturbance characteristics of industrial, scientific and medical (ISM) radio-frequency equipment | Atcelts |
| 55867 | LVS EN 55014:1987/A2:1990 | Limits and methods of measurement of radio disturbance characteristics of electrical motor-operated and thermal appliances for household and similar purposes, electric tools and similar electric apparatus | Atcelts |
| 42031 | LVS EN 61000-4-20:2003 /A1:2007 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides | Atcelts |
| 42599 | EN 55013:2001/IS1:2009 | Sound and television broadcast receivers and associated equipment - Radio disturbance characteristics - Limits and methods of measurement | Atcelts |
| 51411 | LVS EN 61000-3-3:2003 +A1 | Electromagnetic compatibility (EMC) - Part 3: Limits - Section 3: Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current <= 6 A | Atcelts |
| 46889 | LVS EN 61000-4-11:1994 | Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 11: Voltage dips, short interruptions and voltage variations immunity tests | Atcelts |
Displaying 411-420 of 1229 results.