CLC/TC 210
Registration number (WIID) | Project No. | Title | Status |
---|---|---|---|
55775 | LVS EN 61000-4-34:2007 /A1:2010 | Electromagnetic compatibility (EMC) -- Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase (IEC 61034:2005/A1:2009) | Standarts spēkā |
55775 | EN 61000-4-34:2007/A1:2009 | Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase | Izstrādē |
55772 | prEN 61000-2-13 | Electromagnetic compatibility (EMC) - Part 2-13: Environment - High-power electromagnetic (HPEM) environments - Radiated and conducted | Izstrādē |
55759 | EN 55020:2007 | Sound and television broadcast receivers and associated equipment - Immunity characteristics - Limits and methods of measurement | Atcelts |
55759 | LVS EN 55020:2007 | Sound and television broadcast receivers and associated equipment - Immunity characteristics - Limits and methods of measurement | Standarts spēkā |
55745 | LVS EN 61000-4-6:1996/A1:2001 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | Atcelts |
55745 | EN 61000-4-6:1996/A1:2001 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields | Atcelts |
55687 | ENV 50140:1993/prAX | Electromagnetic compatibility - Basic immunity standard - Radiated, radio-frequency electromagnetic field - Immunity test | Izstrādē |
55651 | LVS EN 61000-4-29:2002 | Electromagnetic Compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests | Standarts spēkā |
55651 | EN 61000-4-29:2000 | Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests | Izstrādē |
Displaying 441-450 of 1225 results.