Registration number (WIID)Project No.TitleStatus
4784LVS EN 12543-1:2001Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 1: Scanning methodStandarts spēkā
4814LVS EN 12543-2:2001Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic methodAtcelts
26864LVS EN 12543-2:2008Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic methodAtcelts
67692LVS EN 12543-2:2021Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic methodStandarts spēkā
4815LVS EN 12543-3:2001Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 3: Slit camera radiographic methodStandarts spēkā
4816LVS EN 12543-4:2001Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 4: Edge methodStandarts spēkā
4817LVS EN 12543-5:2001Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubesStandarts spēkā
4819LVS EN 12544-1:2001Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider methodAtcelts
4820LVS EN 12544-2:2001Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 2: Constancy check by the thick filter methodAtcelts
4794LVS EN 12544-3:2001Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 3: Spectrometric methodAtcelts
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