CEN/TC 138
Registration number (WIID) | Project No. | Title | Status |
---|---|---|---|
4794 | EN 12544-3:1999 | Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 3: Spectrometric method | Atcelts |
4820 | EN 12544-2:2000 | Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 2: Constancy check by the thick filter method | Atcelts |
4819 | EN 12544-1:1999 | Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider method | Atcelts |
4817 | EN 12543-5:1999 | Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubes | Izstrādē |
4816 | EN 12543-4:1999 | Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 4: Edge method | Izstrādē |
4815 | EN 12543-3:1999 | Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 3: Slit camera radiographic method | Atcelts |
67692 | EN 12543-2:2021 | Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic method | Atcelts |
26864 | EN 12543-2:2008 | Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic method | Atcelts |
4814 | EN 12543-2:1999 | Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic method | Atcelts |
4784 | EN 12543-1:1999 | Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 1: Scanning method | Atcelts |
Displaying 531-540 of 577 results.