ASD-STAN
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 17487 | LVS EN 2591-204:2000 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 204: Discontinuity of contacts in the microseconds range | Standarts spēkā |
| 17488 | LVS EN 2591-205:2000 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 205: Housing (shell) electrical continuity | Standarts spēkā |
| 17488 | EN 2591-205:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B5: Housing (shell) electrical continuity | Izstrādē |
| 17489 | EN 2591-206:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B6: Measurement of insulation resistance | Izstrādē |
| 17489 | LVS EN 2591-206:2000 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 206: Measurements of insulation resistance | Standarts spēkā |
| 17490 | EN 2591-207:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B7: Voltage proof test | Izstrādē |
| 17490 | LVS EN 2591-207:2000 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 207: Voltage proof test | Standarts spēkā |
| 17491 | LVS EN 2591-208:2000 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 208: Temperature rise due to rated current | Standarts spēkā |
| 17491 | EN 2591-208:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B8: Temperature rise due to rated current | Izstrādē |
| 17492 | EN 2591-209:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B9: Current temperature derating | Izstrādē |
Displaying 1761-1770 of 7134 results.