ASD-STAN
Registration number (WIID) | Project No. | Title | Status |
---|---|---|---|
26503 | EN 2591-225:2007 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 225: RF high potential withstanding voltage | Izstrādē |
26502 | EN 2591-224:2007 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 224: RF leakage | Izstrādē |
26501 | EN 2591-223:2007 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 223: Measurement of characteristic impedance of a coaxial connector or contact | Izstrādē |
26500 | EN 2591-222:2007 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 222: Insertion Loss (I.L.) | Izstrādē |
26499 | EN 2591-221:2007 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 221: Voltage Standing Wave Ratio (VSWR) | Izstrādē |
25332 | EN 2591-220:2005 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 220: Contact/conductor joint ageing by current and temperature cycling | Izstrādē |
21079 | EN 2591-219:2002 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 219: Voltage strength for insulated terminal lugs and in-line splices | Izstrādē |
21078 | EN 2591-218:2002 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 218: Ageing of terminal lugs and in-line splices by temperature and current cycling | Izstrādē |
21077 | EN 2591-217:2002 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 217: Voltage drop under specified current for terminal lugs and in-line splices | Izstrādē |
17531 | EN 2591-216:1997 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 216: Engagement depth of contacts | Izstrādē |
Displaying 6581-6590 of 7119 results.