ASD-STAN
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 21076 | EN 2591-211:2002 | Aerospaces series - Elements of electrical and optical connection - Test Methods - Part 211: Capacitance | Izstrādē |
| 17529 | EN 2591-210:1998 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 210: Electrical overload | Izstrādē |
| 17492 | EN 2591-209:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B9: Current temperature derating | Izstrādē |
| 17491 | EN 2591-208:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B8: Temperature rise due to rated current | Izstrādē |
| 17490 | EN 2591-207:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B7: Voltage proof test | Izstrādē |
| 17489 | EN 2591-206:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B6: Measurement of insulation resistance | Izstrādē |
| 17488 | EN 2591-205:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B5: Housing (shell) electrical continuity | Izstrādē |
| 17487 | EN 2591-204:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B4: Discontinuity of contacts in the microsecond range | Izstrādē |
| 17486 | EN 2591-203:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B3: Electrical continuity at microvolt level | Izstrādē |
| 17485 | EN 2591-202:1996 | Aerospace series - Elements of electrical and optical connection - Test methods - Part B2: Contact resistance at rated current | Izstrādē |
Displaying 6701-6710 of 7235 results.