ISO/IEC JTC 1/SC 17
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 54416 | ISO/IEC 10373-1:2006/Amd 1:2012 | Identification cards - Test methods - Part 1: General characteristics tests - Amendment 1 | Atcelts |
| 34360 | ISO/IEC 7816-1:1998/Amd 1:2003 | Maximum height of the IC contact surface | Atcelts |
| 22831 | ISO/IEC 7501-1:1993 | Identification cards — Machine readable travel documents — Part 1: Machine readable passport | Atcelts |
| 46562 | ISO/IEC 7810:2003/Amd 1:2009 | Criteria for cards containing integrated circuits | Atcelts |
| 30162 | ISO/IEC 10373-2:1998 | Identification cards Test methods | Atcelts |
| 76566 | ISO/IEC 14443-3:2018/Amd 1:2021 | Cards and security devices for personal identification — Contactless proximity objects — Part 3: Initialization and anticollision — Amendment 1: Dynamic power level management | Atcelts |
| 61918 | ISO/IEC 17839-2:2015 | Information technology — Biometric System-on-Card — Part 2: Physical characteristics | Atcelts |
| 59429 | ISO/IEC 10373-6:2011/Amd 1:2012 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes | Atcelts |
| 30164 | ISO/IEC 10373-1:1998 | Identification cards Test methods | Atcelts |
| 31083 | ISO/IEC 10373-3:2001 | Identification cards — Test methods — Part 3: Integrated circuit(s) cards with contacts and related interface devices | Atcelts |
Displaying 301-310 of 533 results.