ISO/IEC JTC 1/SC 17
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 42216 | ISO/IEC 10373-6:2001/Amd 3:2006 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devices | Atcelts |
| 42219 | ISO/IEC 10373-6:2001/Amd 4:2006 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure | Atcelts |
| 42217 | ISO/IEC 10373-6:2001/Amd 5:2007 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16 | Atcelts |
| 52033 | ISO/IEC 10373-6:2001/Amd 7:2010 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassport | Atcelts |
| 55242 | ISO/IEC 10373-6:2001/DAM 1 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes | Izstrādē |
| 58026 | ISO/IEC 10373-6:2001/DAM 11 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 11: Exchange of additional parameters | Izstrādē |
| 55977 | ISO/IEC 10373-6:2001/DAM 2 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbances | Izstrādē |
| 57431 | ISO/IEC 10373-6:2001/DAM 9 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 9: Test methods for electromagnetic disturbances | Izstrādē |
| 57388 | ISO/IEC 10373-6:2001/DAmd 8.2 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 8: Additional PICC classes | Izstrādē |
| 42218 | ISO/IEC 10373-6:2001/NP Amd 6 | Identification cards — Test methods — Part 6: Proximity cards — Amendment 6: ISO/IEC 14443 test environment | Izstrādē |
Displaying 51-60 of 533 results.