ISO/TC 172/SC 9
Registration number (WIID) | Project No. | Title | Status |
---|---|---|---|
54282 | ISO/NP 13682-2 | Lasers and laser-related equipment - Determination of the properties of ultrashort laser pulses - Part2: Autocorrelation measurement method — Part 2: | Izstrādē |
60946 | ISO 17901-1:2015 | Optics and photonics — Holography — Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms | Standarts spēkā |
60947 | ISO 17901-2:2015 | Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics | Standarts spēkā |
60988 | ISO/TS 17915:2013 | Optics and photonics — Measurement method of semiconductor lasers for sensing | Atcelts |
61062 | ISO/NP 17935 | Optics and photonics — Lasers and laser-related equipment — Specification of surface cleanliness | Izstrādē |
61832 | ISO 13694:2015 | Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam power (energy) density distribution | Atcelts |
61833 | ISO 11151-1:2015 | Lasers and laser-related equipment — Standard optical components — Part 1: Components for the UV, visible and near-infrared spectral ranges | Standarts spēkā |
61834 | ISO 11151-2:2015 | Lasers and laser-related equipment — Standard optical components — Part 2: Components for the infrared spectral range | Standarts spēkā |
64144 | ISO 14880-1:2016 | Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties | Atcelts |
65247 | ISO 11145:2016 | Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbols | Atcelts |
Displaying 91-100 of 146 results.