ISO/TC 172/SC 9
Registration number (WIID) | Project No. | Title | Status |
---|---|---|---|
66792 | ISO 19986:2020 | Lasers and laser-related equipment — Test method for angle resolved scattering | Standarts spēkā |
83940 | ISO 14880-2:2024 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations | Standarts spēkā |
52078 | ISO 11252:2013 | Lasers and laser-related equipment — Laser device — Minimum requirements for documentation | Standarts spēkā |
33627 | ISO/TR 11146-3:2004 | Lasers and laser-related equipment — Test methods for laser beam widths, divergence angles and beam propagation ratios — Part 3: Intrinsic and geometrical laser beam classification, propagation and details of test methods | Standarts spēkā |
69227 | ISO/TR 20811:2017 | Optics and photonics — Lasers and laser-related equipment — Laser-induced molecular contamination testing | Standarts spēkā |
76724 | ISO 23701:2023 | Optics and photonics — Laser and laser-related equipment — Photothermal technique for absorption measurement and mapping of optical laser components | Standarts spēkā |
43004 | ISO/TR 21254-4:2011 | Lasers and laser-related equipment — Test methods for laser-induced damage threshold — Part 4: Inspection, detection and measurement | Standarts spēkā |
72944 | ISO 11145:2018 | Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbols | Standarts spēkā |
60947 | ISO 17901-2:2015 | Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics | Standarts spēkā |
72956 | ISO 13696:2022 | Optics and photonics — Test method for total scattering by optical components | Standarts spēkā |
Displaying 101-110 of 146 results.