ISO/TC 172/SC 9
Registration number (WIID) | Project No. | Title | Status |
---|---|---|---|
89697 | ISO/WD 13682-2 | Laser and laser related equipment — Determination of the properties of ultrashort laser pulses — Part 2: Autocorrelation measurement method | Izstrādē |
83937 | ISO 21254-1 | Lasers and laser-related equipment — Test methods for laser-induced damage threshold — Part 1: Definitions and general principles | Izstrādē |
61062 | ISO/NP 17935 | Optics and photonics — Lasers and laser-related equipment — Specification of surface cleanliness | Izstrādē |
90410 | ISO/CD 14880-1 | Optics and photonics — Microlens arrays — Part 1: Vocabulary | Izstrādē |
45852 | ISO/NP 12005 | Lasers and laser-related equipment — Test methods for laser beam parameters — Polarization | Izstrādē |
52956 | ISO/NP 11551 | Optics and optical instruments — Lasers and laser-related equipment — Test method for absorptance of optical laser components | Izstrādē |
90411 | ISO/PWI 25440 | Optics and photonics — Measurement method of propagation loss in passive optical waveguides and components | Izstrādē |
89696 | ISO/WD 13682-1 | Laser and laser related equipment — Determination of the properties of ultrashort laser pulses — Part 1: Vocabulary and Symbols | Izstrādē |
33630 | ISO/WD 15367-3 | Lasers and laser related equipment — Test methods for determination of the shape of a laser beam wavefront — Part 3: Interferometric measurements | Izstrādē |
70725 | ISO/WD 21254-1 | Lasers and laser-related equipment — Test methods for laser-induced damage threshold — Part 1: Definitions and general principles | Izstrādē |
Displaying 11-20 of 146 results.