ISO/TC 172/SC 9
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 42724 | ISO 14880-1:2001/Cor 2:2005 | Optics and photonics — Microlens arrays — Part 1: Vocabulary — Technical Corrigendum 2 | Atcelts |
| 64144 | ISO 14880-1:2016 | Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties | Atcelts |
| 72947 | ISO 14880-1:2019 | Optics and photonics — Microlens arrays — Part 1: Vocabulary | Standarts spēkā |
| 34200 | ISO 14880-2:2006 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations | Atcelts |
| 83940 | ISO 14880-2:2024 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations | Standarts spēkā |
| 36641 | ISO 14880-3:2006 | Optics and photonics — Microlens arrays — Part 3: Test methods for optical properties other than wavefront aberrations | Atcelts |
| 83941 | ISO 14880-3:2024 | Optics and photonics — Microlens arrays — Part 3: Test methods for optical properties other than wavefront aberrations | Standarts spēkā |
| 36642 | ISO 14880-4:2006 | Optics and photonics — Microlens arrays — Part 4: Test methods for geometrical properties | Atcelts |
| 83942 | ISO 14880-4:2024 | Optics and photonics — Microlens arrays — Part 4: Test methods for geometrical properties | Standarts spēkā |
| 25825 | ISO 14881:2001 | Integrated optics — Interfaces — Parameters relevant to coupling properties | Atcelts |
Displaying 71-80 of 146 results.