ISO/TC 172/SC 9
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 36641 | ISO 14880-3:2006 | Optics and photonics — Microlens arrays — Part 3: Test methods for optical properties other than wavefront aberrations | Atcelts |
| 83940 | ISO 14880-2:2024 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations | Standarts spēkā |
| 34200 | ISO 14880-2:2006 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations | Atcelts |
| 72947 | ISO 14880-1:2019 | Optics and photonics — Microlens arrays — Part 1: Vocabulary | Standarts spēkā |
| 64144 | ISO 14880-1:2016 | Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties | Atcelts |
| 42724 | ISO 14880-1:2001/Cor 2:2005 | Optics and photonics — Microlens arrays — Part 1: Vocabulary — Technical Corrigendum 2 | Atcelts |
| 38893 | ISO 14880-1:2001/Cor 1:2003 | Optics and photonics — Microlens arrays — Part 1: Vocabulary — Technical Corrigendum 1 | Atcelts |
| 21141 | ISO 14880-1:2001 | Optics and photonics — Microlens arrays — Part 1: Vocabulary | Atcelts |
| 38483 | ISO 13697:2006 | Optics and photonics — Lasers and laser-related equipment — Test methods for specular reflectance and regular transmittance of optical laser components | Standarts spēkā |
| 72956 | ISO 13696:2022 | Optics and photonics — Test method for total scattering by optical components | Standarts spēkā |
Displaying 71-80 of 146 results.