ISO/TC 213
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 61719 | ISO/PWI 18183-1 | Geometrical product specifications (GPS) — Partioning — Part 1: Basic concepts | Izstrādē |
| 61381 | ISO 16610-49:2015 | Geometrical product specifications (GPS) — Filtration — Part 49: Morphological profile filters: Scale space techniques | Standarts spēkā |
| 61380 | ISO 16610-41:2015 | Geometrical product specifications (GPS) — Filtration — Part 41: Morphological profile filters: Disk and horizontal line-segment filters | Standarts spēkā |
| 61379 | ISO 16610-40:2015 | Geometrical product specifications (GPS) — Filtration — Part 40: Morphological profile filters: Basic concepts | Standarts spēkā |
| 61378 | ISO 16610-29:2015 | Geometrical product specifications (GPS) — Filtration — Part 29: Linear profile filters: Spline wavelets | Atcelts |
| 61377 | ISO 16610-22:2015 | Geometrical product specifications (GPS) — Filtration — Part 22: Linear profile filters: Spline filters | Standarts spēkā |
| 61376 | ISO 16610-20:2015 | Geometrical product specifications (GPS) — Filtration — Part 20: Linear profile filters: Basic concepts | Standarts spēkā |
| 61375 | ISO 16610-1:2015 | Geometrical product specifications (GPS) — Filtration — Part 1: Overview and basic concepts | Standarts spēkā |
| 61261 | ISO 5436-2:2012 | Geometrical product specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 2: Software measurement standards | Standarts spēkā |
| 61236 | ISO 25178-603:2013 | Geometrical product specifications (GPS) — Surface texture: Areal — Part 603: Nominal characteristics of non-contact (phase-shifting interferometric microscopy) instruments | Atcelts |
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