ISO/TC 213
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 10132 | ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters | Atcelts |
| 44475 | ISO 4287:1997/Amd 1:2009 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters — Amendment 1: Peak count number | Atcelts |
| 29874 | ISO 4287:1997/Cor 1:1998 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters — Technical Corrigendum 1 | Atcelts |
| 41861 | ISO 4287:1997/Cor 2:2005 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters — Technical Corrigendum 2 | Atcelts |
| 62307 | ISO 4287:1997/DAmd 2 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters — Amendment 2: Parameters Xsm and Xc | Izstrādē |
| 10133 | ISO 4287-2:1984 | Surface roughness — Terminology — Part 2: Measurement of surface roughness parameters | Atcelts |
| 10134 | ISO 4288:1985 | Rules and procedures for the measurement of surface roughness using stylus instruments | Atcelts |
| 2096 | ISO 4288:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and procedures for the assessment of surface texture | Atcelts |
| 29875 | ISO 4288:1996/Cor 1:1998 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and procedures for the assessment of surface texture — Technical Corrigendum 1 | Atcelts |
| 10135 | ISO 4291:1985 | Methods for the assessement of departure from roundness — Measurement of variations in radius | Standarts spēkā |
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