Registration number (WIID)Project No.TitleStatus
72946ISO 17915:2018Optics and photonics — Measurement method of semiconductor lasers for sensingStandarts spēkā
52078ISO 11252:2013Lasers and laser-related equipment — Laser device — Minimum requirements for documentationStandarts spēkā
45523ISO/TR 14880-5:2010Optics and photonics — Microlens arrays — Part 5: Guidance on testingStandarts spēkā
69227ISO/TR 20811:2017Optics and photonics — Lasers and laser-related equipment — Laser-induced molecular contamination testingStandarts spēkā
72974ISO 14881:2021Integrated optics — Interfaces — Parameters relevant to coupling propertiesStandarts spēkā
72947ISO 14880-1:2019Optics and photonics — Microlens arrays — Part 1: VocabularyStandarts spēkā
45011ISO 11553-3:2013Safety of machinery — Laser processing machines — Part 3: Noise reduction and noise measurement methods for laser processing machines and hand-held processing devices and associated auxiliary equipment (accuracy grade 2)Standarts spēkā
75857ISO 13142:2021Optics and photonics — Lasers and laser-related equipment — Cavity ring-down method for high-reflectance and high-transmittance measurementsStandarts spēkā
65248ISO 11810:2015Lasers and laser-related equipment — Test method and classification for the laser resistance of surgical drapes and/or patient protective covers — Primary ignition, penetration, flame spread and secondary ignitionStandarts spēkā
31690ISO 11670:2003Lasers and laser-related equipment — Test methods for laser beam parameters — Beam positional stabilityStandarts spēkā
Displaying 131-140 of 146 results.