Registration number (WIID)Project No.TitleStatus
45523ISO/TR 14880-5:2010Optics and photonics — Microlens arrays — Part 5: Guidance on testingStandarts spēkā
72946ISO 17915:2018Optics and photonics — Measurement method of semiconductor lasers for sensingStandarts spēkā
41919ISO/TR 11146-3:2004/Cor 1:2005Lasers and laser-related equipment — Test methods for laser beam widths, divergence angles and beam propagation ratios — Part 3: Intrinsic and geometrical laser beam classification, propagation and details of test methods — Technical Corrigendum 1Standarts spēkā
40510ISO 11670:2003/Cor 1:2004Lasers and laser-related equipment — Test methods for laser beam parameters — Beam positional stability — Technical Corrigendum 1Standarts spēkā
31690ISO 11670:2003Lasers and laser-related equipment — Test methods for laser beam parameters — Beam positional stabilityStandarts spēkā
60946ISO 17901-1:2015Optics and photonics — Holography — Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of hologramsStandarts spēkā
69228ISO 11551:2019Optics and photonics — Lasers and laser-related equipment — Test method for absorptance of optical laser componentsStandarts spēkā
83940ISO 14880-2:2024Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrationsStandarts spēkā
72944ISO 11145:2018Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbolsStandarts spēkā
60947ISO 17901-2:2015Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristicsStandarts spēkā
Displaying 1-10 of 151 results.