ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 32939 | ISO/CD 17270 | Analytical electron microscopy — Test method to determine experimental parameters for electron energy loss spectroscopy (EELS) | Izstrādē |
| 84289 | ISO/CD 13139 | Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals | Izstrādē |
| 86942 | ISO 29301:2023 | Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures | Standarts spēkā |
| 70360 | ISO 29301:2017 | Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures | Atcelts |
| 45399 | ISO 29301:2010 | Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures | Atcelts |
| 87733 | ISO 25498:2025 | Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope | Standarts spēkā |
| 70359 | ISO 25498:2018 | Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope | Atcelts |
| 42951 | ISO 25498:2010 | Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope | Atcelts |
| 90100 | ISO 25387:2026 | Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope | Standarts spēkā |
| 79091 | ISO 24639:2022 | Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy | Standarts spēkā |
Displaying 11-20 of 25 results.