ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 32939 | ISO/CD 17270 | Analytical electron microscopy — Test method to determine experimental parameters for electron energy loss spectroscopy (EELS) | Izstrādē |
| 42950 | ISO/NP 25497 | Guidelines for the determination of experimental parameters for electron energy loss spectroscopy | Izstrādē |
| 42951 | ISO 25498:2010 | Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope | Atcelts |
| 42952 | ISO/NP 25499 | Guidelines for the energy calibration and energy resolution determination methods for electron energy loss spectroscopy | Izstrādē |
| 45355 | ISO/WD 29222 | Standards for thickness measurement of thin films by TEM-EELS and STEM-EDS analytical electron microscopy at the nanometer and sub-nanometer level | Izstrādē |
| 45399 | ISO 29301:2010 | Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures | Atcelts |
| 60576 | ISO/WD 17802 | Microbeam analysis — Analytical transmission electron microscopy — Methods of the energy calibration for electron energy loss spectroscopy | Izstrādē |
| 64022 | ISO 19214:2017 | Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy | Standarts spēkā |
| 67438 | ISO 20263:2017 | Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials | Atcelts |
| 70359 | ISO 25498:2018 | Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope | Atcelts |
Displaying 1-10 of 25 results.