ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 84289 | ISO/CD 13139 | Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals | Izstrādē |
| 91666 | ISO/NP 25835 | Microbeam analysis — Analytical electron microscopy — Method for data acquisition and processing of three-dimensional electron diffraction | Izstrādē |
| 90097 | ISO/PWI 25386 | Microbeam Analysis-Analytical Electron Microscopy-The main performance parameters and design specifications of the TEM standard grid | Izstrādē |
| 91808 | ISO/CD 25871 | Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction | Izstrādē |
| 42950 | ISO/NP 25497 | Guidelines for the determination of experimental parameters for electron energy loss spectroscopy | Izstrādē |
| 32939 | ISO/CD 17270 | Analytical electron microscopy — Test method to determine experimental parameters for electron energy loss spectroscopy (EELS) | Izstrādē |
| 91667 | ISO/PWI 25836 | Microbeam analysis – Analytical electron microscope - Phase identification of metals and oxides by precession electron diffraction | Izstrādē |
| 92612 | ISO/CD 26100 | Microbeam analysis — Analytical electron microscopy — The thickness measurement of thin foil by electron energy loss spectroscopy | Izstrādē |
| 84838 | ISO/DIS 16887 | Microbeam analysis — Analytical electron microscopy — Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system | Izstrādē |
| 45355 | ISO/WD 29222 | Standards for thickness measurement of thin films by TEM-EELS and STEM-EDS analytical electron microscopy at the nanometer and sub-nanometer level | Izstrādē |
Displaying 1-10 of 25 results.