Registration number (WIID)Project No.TitleStatus
64022ISO 19214:2017Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopyStandarts spēkā
87682ISO 20263:2024Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materialsStandarts spēkā
87733ISO 25498:2025Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscopeStandarts spēkā
79091ISO 24639:2022Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopyStandarts spēkā
86203ISO 19214:2024Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopyStandarts spēkā
86942ISO 29301:2023Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structuresStandarts spēkā
90100ISO 25387:2026Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscopeStandarts spēkā
42951ISO 25498:2010Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscopeAtcelts
67438ISO 20263:2017Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materialsAtcelts
70360ISO 29301:2017Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structuresAtcelts
Displaying 1-10 of 25 results.