ISO/TC 202/SC 3

Registration number (WIID)Project No.TitleStatus
64022ISO 19214:2017Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopyStandarts spēkā
86203ISO 19214:2024Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopyStandarts spēkā
67438ISO 20263:2017Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materialsAtcelts
87682ISO 20263:2024Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materialsStandarts spēkā
75516ISO 23420:2021Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysisAtcelts
79091ISO 24639:2022Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopyStandarts spēkā
90100ISO 25387:2026Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscopeStandarts spēkā
42951ISO 25498:2010Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscopeAtcelts
70359ISO 25498:2018Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscopeAtcelts
87733ISO 25498:2025Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscopeStandarts spēkā
Displaying 1-10 of 25 results.