ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 70360 | ISO 29301:2017 | Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures | Atcelts |
| 75516 | ISO 23420:2021 | Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis | Atcelts |
| 79091 | ISO 24639:2022 | Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy | Standarts spēkā |
| 84289 | ISO/CD 13139 | Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals | Izstrādē |
| 84838 | ISO/DIS 16887 | Microbeam analysis — Analytical electron microscopy — Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system | Izstrādē |
| 86203 | ISO 19214:2024 | Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy | Standarts spēkā |
| 86942 | ISO 29301:2023 | Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures | Standarts spēkā |
| 87682 | ISO 20263:2024 | Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials | Standarts spēkā |
| 87733 | ISO 25498:2025 | Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope | Standarts spēkā |
| 90097 | ISO/PWI 25386 | Microbeam Analysis-Analytical Electron Microscopy-The main performance parameters and design specifications of the TEM standard grid | Izstrādē |
Displaying 11-20 of 25 results.