ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 75516 | ISO 23420:2021 | Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis | Atcelts |
| 87682 | ISO 20263:2024 | Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials | Standarts spēkā |
| 67438 | ISO 20263:2017 | Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials | Atcelts |
| 86203 | ISO 19214:2024 | Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy | Standarts spēkā |
| 64022 | ISO 19214:2017 | Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy | Standarts spēkā |
Displaying 21-25 of 25 results.