ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 90100 | ISO 25387:2026 | Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope | Standarts spēkā |
| 91666 | ISO/NP 25835 | Microbeam analysis — Analytical electron microscopy — Method for data acquisition and processing of three-dimensional electron diffraction | Izstrādē |
| 91667 | ISO/PWI 25836 | Microbeam analysis – Analytical electron microscope - Phase identification of metals and oxides by precession electron diffraction | Izstrādē |
| 91808 | ISO/CD 25871 | Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction | Izstrādē |
| 92612 | ISO/CD 26100 | Microbeam analysis — Analytical electron microscopy — The thickness measurement of thin foil by electron energy loss spectroscopy | Izstrādē |
Displaying 21-25 of 25 results.