ISO/TC 213
Registration number (WIID) | Project No. | Title | Status |
---|---|---|---|
44740 | ISO 286-2:1988/Cor 1:2006 | Atcelts | |
45308 | ISO 5436-2:2001/Cor 1:2006 | Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 2: Software measurement standards — Technical Corrigendum 1 | Atcelts |
45454 | ISO 3611:2010 | Geometrical product specifications (GPS) — Dimensional measuring equipment: Micrometers for external measurements — Design and metrological characteristics | Atcelts |
45937 | ISO 10360-6:2001/Cor 1:2007 | Geometrical Product Specifications (GPS) — Acceptance and reverification tests for coordinate measuring machines (CMM) — Part 6: Estimation of errors in computing Gaussian associated features — Technical Corrigendum 1 | Standarts spēkā |
45974 | ISO 1101:2004/FDAmd 1 | Geometrical Product Specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out — Amendment 1: Representation of specifications in the form of a 3D model | Izstrādē |
45975 | ISO 286-1:2010 | Geometrical product specifications (GPS) — ISO code system for tolerances on linear sizes — Part 1: Basis of tolerances, deviations and fits | Standarts spēkā |
46065 | ISO 25178-1:2016 | Geometrical product specifications (GPS) — Surface texture: Areal — Part 1: Indication of surface texture | Standarts spēkā |
46066 | ISO/PWI TS 25178-702 | Geometrical product specifications (GPS) — Surface texture: Areal — Part 702: Calibration and measurement standards for non-contact (confocal chromatic probe) instruments | Izstrādē |
46067 | ISO/PWI TS 25178-703 | Geometrical product specifications (GPS) — Surface texture: Areal — Part 703: Calibration and measurement standards for non-contact (phase-shifting interferometric microscopy) instruments | Izstrādē |
46106 | ISO/TS 14253-2:1999/Cor 1:2007 | Geometrical Product Specifications (GPS) — Inspection by measurement of workpieces and measuring equipment — Part 2: Guide to the estimation of uncertainty in GPS measurement, in calibration of measuring equipment and in product verification — Technical Corrigendum 1 | Atcelts |
Displaying 261-270 of 479 results.