Registration number (WIID)Project No.TitleStatus
4815EN 12543-3:1999Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 3: Slit camera radiographic methodAtcelts
4815LVS EN 12543-3:2001Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 3: Slit camera radiographic methodStandarts spēkā
4816EN 12543-4:1999Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 4: Edge methodIzstrādē
4816LVS EN 12543-4:2001Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 4: Edge methodStandarts spēkā
4817EN 12543-5:1999Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubesIzstrādē
4817LVS EN 12543-5:2001Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubesStandarts spēkā
4818CEN/TC 138/WG1 N 144Non-destructive testing - Characteristics of focal spots in industrial X-ray tube assemblies for use in NDT - Part 5: Wire method for use in radioscopyIzstrādē
4819EN 12544-1:1999Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider methodAtcelts
4819LVS EN 12544-1:2001Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider methodAtcelts
4820EN 12544-2:2000Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 2: Constancy check by the thick filter methodAtcelts
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