ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 45399 | ISO 29301:2010 | Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures | Atcelts |
| 70360 | ISO 29301:2017 | Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures | Atcelts |
| 86942 | ISO 29301:2023 | Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures | Standarts spēkā |
| 84289 | ISO/CD 13139 | Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals | Izstrādē |
| 32939 | ISO/CD 17270 | Analytical electron microscopy — Test method to determine experimental parameters for electron energy loss spectroscopy (EELS) | Izstrādē |
| 91808 | ISO/CD 25871 | Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction | Izstrādē |
| 92612 | ISO/CD 26100 | Microbeam analysis — Analytical electron microscopy — The thickness measurement of thin foil by electron energy loss spectroscopy | Izstrādē |
| 84838 | ISO/DIS 16887 | Microbeam analysis — Analytical electron microscopy — Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system | Izstrādē |
| 42950 | ISO/NP 25497 | Guidelines for the determination of experimental parameters for electron energy loss spectroscopy | Izstrādē |
| 42952 | ISO/NP 25499 | Guidelines for the energy calibration and energy resolution determination methods for electron energy loss spectroscopy | Izstrādē |
Displaying 11-20 of 25 results.