ISO/TC 202/SC 3

Registration number (WIID)Project No.TitleStatus
84838ISO/DIS 16887Microbeam analysis — Analytical electron microscopy — Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam systemIzstrādē
60576ISO/WD 17802Microbeam analysis — Analytical transmission electron microscopy — Methods of the energy calibration for electron energy loss spectroscopyIzstrādē
70360ISO 29301:2017Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structuresAtcelts
42951ISO 25498:2010Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscopeAtcelts
45399ISO 29301:2010Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structuresAtcelts
70359ISO 25498:2018Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscopeAtcelts
67438ISO 20263:2017Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materialsAtcelts
75516ISO 23420:2021Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysisAtcelts
90100ISO 25387:2026Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscopeStandarts spēkā
87682ISO 20263:2024Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materialsStandarts spēkā
Displaying 11-20 of 25 results.