ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 75516 | ISO 23420:2021 | Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis | Atcelts |
| 67438 | ISO 20263:2017 | Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials | Atcelts |
| 42951 | ISO 25498:2010 | Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope | Atcelts |
| 60576 | ISO/WD 17802 | Microbeam analysis — Analytical transmission electron microscopy — Methods of the energy calibration for electron energy loss spectroscopy | Izstrādē |
| 42950 | ISO/NP 25497 | Guidelines for the determination of experimental parameters for electron energy loss spectroscopy | Izstrādē |
| 92612 | ISO/CD 26100 | Microbeam analysis — Analytical electron microscopy — The thickness measurement of thin foil by electron energy loss spectroscopy | Izstrādē |
| 32939 | ISO/CD 17270 | Analytical electron microscopy — Test method to determine experimental parameters for electron energy loss spectroscopy (EELS) | Izstrādē |
| 91667 | ISO/PWI 25836 | Microbeam analysis – Analytical electron microscope - Phase identification of metals and oxides by precession electron diffraction | Izstrādē |
| 91666 | ISO/NP 25835 | Microbeam analysis — Analytical electron microscopy — Method for data acquisition and processing of three-dimensional electron diffraction | Izstrādē |
| 90097 | ISO/PWI 25386 | Microbeam Analysis-Analytical Electron Microscopy-The main performance parameters and design specifications of the TEM standard grid | Izstrādē |
Displaying 11-20 of 25 results.