ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 64022 | ISO 19214:2017 | Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy | Standarts spēkā |
| 87682 | ISO 20263:2024 | Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials | Standarts spēkā |
| 90100 | ISO 25387:2026 | Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope | Standarts spēkā |
| 87733 | ISO 25498:2025 | Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope | Standarts spēkā |
| 79091 | ISO 24639:2022 | Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy | Standarts spēkā |
Displaying 21-25 of 25 results.