ISO/TC 202/SC 3
| Registration number (WIID) | Project No. | Title | Status |
|---|---|---|---|
| 84838 | ISO/DIS 16887 | Microbeam analysis — Analytical electron microscopy — Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system | Izstrādē |
| 91808 | ISO/CD 25871 | Microbeam analysis --Analytical electron microscopy — Method of thickness measurement for thin crystals by convergent beam electron diffraction | Izstrādē |
| 84289 | ISO/CD 13139 | Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals | Izstrādē |
| 45355 | ISO/WD 29222 | Standards for thickness measurement of thin films by TEM-EELS and STEM-EDS analytical electron microscopy at the nanometer and sub-nanometer level | Izstrādē |
| 42952 | ISO/NP 25499 | Guidelines for the energy calibration and energy resolution determination methods for electron energy loss spectroscopy | Izstrādē |
Displaying 21-25 of 25 results.